Desenvolvimento de um sistema de teste de confiabilidade BURN-IN de baixo custo para fontes chaveadas para simulação da vida útil do produto, com capacidade reduzida

Abstract

The present work has as objective to present the development of a life test system, destined to switched power supplies, with a low capacity of units to be tested, and having a small economic cost of investment. The system developed uses the Raspberry microprocessor module, which together with relays, sensors and display, form the components used in this project, for a simulation of switching on and off of the switching power supplies. Measured values of voltage, current, temperature and ambient humidity are collected through the sensors and their data stored for system monitoring and validation. A study was carried out seeking the theoretical foundation for the development of this work, on the following topics: concepts of reliability tests and their main types; Burn-in testicles; functioning of switched sources and their main components. Furthermore, studies referring to microcontrollers, sensors and relays, which were used in the assembly of the prototype, are explored. In addition, the steps and materials used to build the Burn-in test system are presented, followed by a detailed description of the experiment, tools and programs used. As a result of the experiences throughout the work, the reading graphs of the values collected by the voltage and current sensors are selected, after carrying out the simulation tests of the useful life, with activations, shutdowns and load simulation at the output of the adapters for a certain period . Finally, the data obtained showed that the developed device meets the proposed activation, control and monitoring requirements of a lifetime test in a switched source.